发明名称 |
Anodic oxidn. appts. for silicon wafer - with tungsten wire reference electrode over wafer for controlled oxidn. of defect pn-junction |
摘要 |
<p>Appts. for the anodic oxidn. of a Si wafer, which is made the anode in a cell (1) filled with electrolyte and having a noble metal cathode, also has a W wire (5) as reference electrode, which is placed over the Si wafer (3) and pref. ca. 1 mm from this. Pref. the W wire is (partly) coated with oxide. The Si wafer is placed on a metal or graphite plate (2) and is parallel to a Pt cathode. The appts. is specified for use in the anodic oxidn. of Si wafers with defect pn-junctions. Defect pn-junctions and transistors with low breakdown voltage or high leakage current can be oxidised selectively.</p> |
申请公布号 |
DE2952157(A1) |
申请公布日期 |
1981.06.25 |
申请号 |
DE19792952157 |
申请日期 |
1979.12.22 |
申请人 |
IBM DEUTSCHLAND GMBH |
发明人 |
SCHMITT,DIPL.-PHYS.DR.,ALFRED |
分类号 |
C25D11/32;(IPC1-7):25D11/32 |
主分类号 |
C25D11/32 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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