发明名称 MANUFACTURE OF SEMICONDUCTOR DEVICE
摘要 PURPOSE:To facilitate the integration, by using ion implantation method for the formation of an insular impurity region serving as a source or drain. CONSTITUTION:N type impurity with high density is implanted into the position of the attachment of a source and drain electrodes by ion beam 13, after the formation of semi-insulating GaAs layer 2, GaAs layer 3, Ga0.7Al0.3 As layer 4, GaAs layer 5 and mask 12 on a substrate 1. After the mask 12 is removed, the mask 12 is formed again with the implantation of Se ion 14 to form an n type channel 7. Next, a source drain electrodes and gate electrode, etc. are formed by a usual method.
申请公布号 JPS57160171(A) 申请公布日期 1982.10.02
申请号 JP19810045555 申请日期 1981.03.30
申请人 HITACHI SEISAKUSHO KK 发明人 FUKUZAWA KAORU;NAKASHIMA HISAO;MATSUNAGA NOBUTOSHI;TAKAHASHI SUSUMU;NAKAMURA MICHIHARU
分类号 H01L21/331;H01L21/338;H01L29/73;H01L29/778;H01L29/80;H01L29/812 主分类号 H01L21/331
代理机构 代理人
主权项
地址