| 摘要 |
PURPOSE:To obtain a semiconductor storage device which can reduce the test time for memory cells, has high reliability of tests and avoids an increase in costs by dividing memory cell parts to a plurality and incorporating specific parallel decision circuits in the device. CONSTITUTION:Memory cell parts 23 which are divided to a plurality, means 16-22 which write or read test data parallel into or from these plural parts 23, and a parallel decision means 29 which decides whether the same data are obtained with the corresponding memory elements of the respective memory cells 23 or not from the data read out from the cells 23 are provided. Also, input circuits 18, and output 34 which select the plural cells 23 and write or read the data into or from the selected memory elements of the selected cells 23 are provided. |
