| 摘要 |
PURPOSE:To facilitate detection of address positions, by providing marks at the periphery or inside of a memory cell array at every specified mulitple of a memory cell pitch. CONSTITUTION:A mark pattern 2 is provided at the periphery of the memory cell array 1 at every specified multiple of the memory cell pitch. When the marks are provided, it is easy to find the memory cells which contain defective bits. Therefore it is helpful to count the number of the memory cells, and it is clear that the time is shortened. The marks can be provided in the memory cell array. The marks can be provided by deforming a part of a repeating pattern. |
