| 摘要 |
PURPOSE:To diagnose the package level with the test pattern of an LSI, by using a test pattern formed for the LSI and an activated pattern of main output and input of the LSI. CONSTITUTION:A main output group 24 of an LSI 201 in a package is connected to a main input group 7 of an LSI202, a main output group 8 of the LSI 202 is connected to a main input group 22 of an LSI203, and main input groups 21, 23 of the LSIs 202, 203 are connected to a main input group 207 of the package. A scanning control circuit 204 of the package is controlled to a scanning control circuit of each LSI. The circuit 204 is connected to the main input group 205 and the main output group 206 for scanning control of the package. The test pattern of an LSI is extended to that for the package level for the diagnosis of the package by using an output activated pattern to guarantee the value of (0) or (1) of each LSI to the main output and the input activated pattern leading the value of (0) or (1) of the main input of the LSI to the main output of the LSI or FFs 25, 2, 4, 28 in the LSI. |
