发明名称 MANUFACTURE OF SEMICONDUCTOR DEVICE
摘要 PURPOSE:To prevent breaking through and obtain smooth electrode wiring by providing electrode wiring after making shallow the window by selectively forming the epitaxial growth layer within the electrode window. CONSTITUTION:An epitaxial layer 5 is selectively formed on a diffusion layer 3 within an electrode window of an insulating film 2, an impurity of the same conductivity type as the layer 3 is doped into the layer 5 with a high concentration, and thereafter an electrode wiring 4 is conducted. Since the layer 5 of the same conductivity type exists within the window, depth of diffusion substantially increases, a degree of margin for the breaking through also increases at the time of forming the electrode wiring 4 and simultaneously a degree of stepped portion is reduced, thereby, smooth wiring can be obtained. The layer 5 becomes a single crystal having a low resistance resulting in any problem.
申请公布号 JPS5976424(A) 申请公布日期 1984.05.01
申请号 JP19820188557 申请日期 1982.10.25
申请人 MITSUBISHI DENKI KK 发明人 TOBINAGA MINETO
分类号 H01L21/28;(IPC1-7):01L21/28 主分类号 H01L21/28
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