发明名称
摘要 PURPOSE:To shorten both the fault time and its repair time by securing an automatic fault indication for the scattered logic blocks via the external unit. CONSTITUTION:The data comprising 64 units of information bits and 8 units of test bits is divided into 4 blocks and then supplied to data control circuits A1-A4 including the error detection/correction units of the same structure. At the same time, registers B1-B4 to hole the data composed of 18 bits are provided along with register output lines C1-C4 plus syndrome growing circuits G1-G4. Each of the bit lines is shown by S0-S7 which will be all ''0'' in case the information bit has some fault. And the single error is shown when odd units of ''1'' exist, and more than 2 or even units of error are shown in case even units of ''1'' exist respectively. These decisions are given at error bit decision circuit 2. Then error position indication signal line 3 is provided, and the register output of B1-B4 are corrected through correction circuits E1-E4.
申请公布号 JPS6029979(B2) 申请公布日期 1985.07.13
申请号 JP19780067430 申请日期 1978.06.05
申请人 MITSUBISHI ELECTRIC CORP 发明人 FUJII NORIKAZU
分类号 H04L1/00;G06F11/08;G06F11/10;G06F11/22 主分类号 H04L1/00
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