摘要 |
PURPOSE:To permit checking of signals and others in an electron microscope without using an oscilloscope by employing a waveform monitor mode for checking. CONSTITUTION:When switch means 5 is switched from A position to B position to connect a mode selecting circuit 3 to an image amplifier 9, the signal sent to a preamplifier 7 through a check circuit 6 is displayed on an observing CRT4 according to the peak value and frequency selected by a display switching circuit 8. In order to execute comparison with preceding display signals, the means 5 is switched to C position to connect the mode selecting circuit 3 to a memory circuit 10. Then, signals previously displayed and stored in the circuit 10 are displayed on the CRT4. This system can omit connecting operation to an oscilloscope and measuring terminals. Furthermore, operation is simple and data can be memoried, permitting ready comparison of check and other treatment. |