| 摘要 |
PURPOSE:To shorten the test time, and to obtain a high reliability by providing a test use electrode on a programmable ROM, and executing independently its test through this electrode. CONSTITUTION:A CPU, an input/output circuit I/O, a timer circuit TM, also a RAM, and a EPROM are provided on a semiconductor substrate, and bonding pads P which are coupled to a power source terminal, an input terminal, an output terminal, and various control terminals, etc. are placed in the peripheral part of the semiconductor substrate. In addition to these bonding pads P, a test use electrode (pad) TP is provided in the peripheral part of the EPROM. In this way, various tests of the EPROM can be executed efficiently in a short time through this pad. |
