首页
产品
黄页
商标
征信
会员服务
注册
登录
全部
|
企业名
|
法人/股东/高管
|
品牌/产品
|
地址
|
经营范围
发明名称
MEASURING DEVICE FOR WEAK MAGNETIC FIELD
摘要
申请公布号
JPS61250575(A)
申请公布日期
1986.11.07
申请号
JP19860094369
申请日期
1986.04.23
申请人
SIEMENS AG
发明人
EKUHARUTO HEENITSUHI;HANSU IERUKU WAISE
分类号
A61B5/04;G01R33/035;H01R4/68
主分类号
A61B5/04
代理机构
代理人
主权项
地址
您可能感兴趣的专利
MIRRORING STORAGE INTERFACE
MICROSERVER TEST PORT RETROFIT KIT
HTML FILE PROCESSING METHOD AND PROGRAM
Wireless physiological monitoring system
RAW MIX POWDER COMPOSITION AND METHOD FOR MAKING SAME
POSITIVE CHARGE TYPE MAGNETIC TONER
SEMICONDUCTOR DEVICE AND ITS MANUFACTURING METHOD
HIGH-SPEED HOLOGRAPHIC DATA RECORDING MEDIUM AND METHOD
NOSE PAD FOR SPECTACLES
METHOD OF MOLDING ELECTRODE PLATE OF ELECTRIC DOUBLE CAPACITOR, ELECTRODE PLATE MOLDING APPARATUS, AND METHOD OF MANUFACTURING ELECTRIC DOUBLE LAYER CAPACITOR
METHOD OF MANUFACTURING ELECTRIC DOUBLE LAYER CAPACITOR
SPEECH ENCODING METHOD AND SPEECH DECODING METHOD
HIGH-VOLTAGE POWER SUPPLY AND MANUFACTURING METHOD THEREFOR
AC ADAPTER
PORTABLE STANDBY POWER SUPPLY
METHOD FOR MANUFACTURING POWER CONVERTER
INSULATION STRUCTURE OF COIL FOR ROTARY ELECTRIC MACHINE
ADDRESS ASSIGNMENT BASED ON RANKING IN MODULAR SYSTEM
BATTERY CHARGER
METHOD AND APPARATUS FOR GAMMA CORRECTION AND FLAT PANEL DISPLAY USING THE SAME
