(A) ;METHOD AND APPARATUS FOR MEASURING FLAW DIMENSION BY ANALYSIS OF ULTRASONIC FREQUENCY,申请号JP19850067498U-传众专利搜索

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发明名称	(A) ;METHOD AND APPARATUS FOR MEASURING FLAW DIMENSION BY ANALYSIS OF ULTRASONIC FREQUENCY
摘要
申请公布号	JPS61184457(U)	申请公布日期	1986.11.17
申请号	JP19850067498U	申请日期	1985.05.08
申请人		发明人
分类号	A47C7/38;B60N2/48;(IPC1-7):A47C7/38;B60N1/06	主分类号	A47C7/38
代理机构		代理人
主权项
地址

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