| 摘要 |
PURPOSE:To test the high-speed operation of an integrated circuit with a high accuracy by a simple instrument by dividing the output signals of a ring oscillator having the delay path of a critical path as part of a loop into a frequency that can be measured by a tester. CONSTITUTION:An operation is initiated by inputting an H level to the operation control input terminal 1 of a ring oscillator circuit composed by the delay path portion 3 of a critical path and gates G1 and G2. The output signals of a ring oscillator are divided by a dividing circuit 4 at an optimum dividing ratio corresponding to the frequency resolving power and the strobe signal resolving power of a tester for conducting a test and the signals outputted from an output terminal 2 are measured by the tester.
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