| 摘要 |
PURPOSE:To shorten the testing time, by constituting a testing adaptor so as to be mounted to the connection terminal of the mount substrate mounted to a surface mounting type semiconductive device in a detachable manner. CONSTITUTION:A testing adaptor 1 is constituted so as to be electrically connected to the connection terminal 4A of the mount substrate 4 mounting to a surface mounting type semiconductive device such as FPP (flat plastic package) or PLCC (plastic leadless chip carrier) and has a connection pin 1A, a support member 1B, a mount member 1C and a cap 1D. Thus constituted connection pin 1A always undergoes the action of an elastic member 1F in a direction contacted with the connection terminal 4A and, therefore, can be certainly connected to the connection terminal 4A.
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