发明名称 |
POSITIVE TYPE PHOTORESIST COMPOSITION HAVING IMPROVED HEAT RESISTANCE |
摘要 |
PURPOSE:To obtain a positive type photoresist having superior heat resistance and fit for post-baking at high temp., dry etching, ion implantation and metallic vapor deposition by using cresol-novolak resin having >=160 deg.C softening point. CONSTITUTION:When a positive type photoresist composition contg. an alkali- soluble resin and at least one kind of quinonediazido compound as essential components is produced, cresol-novolak resin having >=160 deg.C softening point is used as the alkali-soluble resin. The amount of the quinonediazido compound is 5-100pts.wt. per 100pts.wt. cresol-novolak resin. In case of <5pts.wt. quinonediazido compound, a high contrast pattern is not obtd. because the difference in solubility in a developer between exposed and unexposed parts is not sufficient. In case of >100pts.wt. quinonediazido compound, a resist film on a substrate is brittle and a pattern is liable to be scratched and peels from the substrate during the handling of the wafer. |
申请公布号 |
JPS62201430(A) |
申请公布日期 |
1987.09.05 |
申请号 |
JP19860042837 |
申请日期 |
1986.03.01 |
申请人 |
NIPPON ZEON CO LTD;FUJITSU LTD |
发明人 |
TAKAHASHI SHINICHI;YAJIMA MIKIO;KAWADA MASAJI;SUGIMOTO SADAO;YAMAZAKI MASAHIRO;FUJINO KATSUHIRO |
分类号 |
C08K5/28;C08L61/18;G03C1/72 |
主分类号 |
C08K5/28 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|