发明名称 PLATE THICKNESS CONTROL METHOD
摘要 <p>PURPOSE:To improve the plate thickness accuracy by performing an independent and automatic thickness control at each stand, comparing each draft position deviation amount of adjacent stands, and eliminating a draft imbalance between the stands based on the above comparison. CONSTITUTION:Gage meter type automatic plate thickness controls at adjacent stands (i-1) and (i) are prepared, respectively. Then, draft position deviation amounts DELTASi and DELTASi-1 of the respective adjacent stands are compared in addition to the above independent control. In other words, a plate thickness deviation at the former stand is varied when a biaslike draft correction amount being additional to an automatic draft control amount is added to the deviation amount DELTASi-1. In that time, the deviation is varied so that a relative ratio between the deviation amounts DELTASi and DELTASi-1 reaches a constant value. In that way, the plate thickness accuracy and the plate flatness are remarkably improved because a draft imbalance between adjacent stands is eliminated.</p>
申请公布号 JPS62270208(A) 申请公布日期 1987.11.24
申请号 JP19860111876 申请日期 1986.05.16
申请人 SUMITOMO METAL IND LTD 发明人 MIURA HIROAKI
分类号 B21B37/00;B21B37/16;B21B37/58 主分类号 B21B37/00
代理机构 代理人
主权项
地址