PROBE FOR EDDY-CURRENT FLAW DETECTION,申请号JP19870277448-传众专利搜索

首页产品黄页商标征信

会员服务注册登录

法人/股东/高管

发明名称	PROBE FOR EDDY-CURRENT FLAW DETECTION
摘要
申请公布号	JPH01119758(A)	申请公布日期	1989.05.11
申请号	JP19870277448	申请日期	1987.11.04
申请人	HITACHI LTD	发明人	ICHINOSE YUJI;FURUKAWA TOSHIYUKI;SAWA TOSHIYUKI
分类号	G01N27/90	主分类号	G01N27/90
代理机构		代理人
主权项
地址

您可能感兴趣的专利

Micro electro-mechanical system and method of manufacturing the same

SEMICONDUCTOR-ON-INSULATOR(SOI) STRUCTURES INCLUDING GRADIENT NITRIDED BURIED OXIDE (BOX)

SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING SAME

Intride-based semiconductor light emitting diode and method of manufacturing the same

Nitride-based semiconductor element and method of forming nitride-based semiconductor

Pixel, organic light emitting display using the same, and associated methods

Transport Seating

LIGHT ILLUMINATING ELEMENT

HOMEOSTATIC FLYING HOVERCRAFT

Method for Mounting an Aircraft Engine on a Rigid Structure of a Strut for Locking the Engine

Revolving Rack for Chain Spools

Variable Speed Blower Control In An HVAC System Having A Plurality of Zones

Fixing structure for printed circuit board of micro motor

Squeezing detection control method for consumable electrode arc welding

Process and Device for Separation of Liquids Emulsified in Mixtures of Liquids and Gases Dissolved in Mixtures of Liquids and Gases by Localized Pressure Reduction

Reversible Child Resistant Cap And Combination Of A Container And A Reversible Child Resistant Cap

Production of Biodiesel Fuels Which Are Low In Glycerin And Sulfur

Friction Plate for Wet-Type Multiplate Clutch

CASING AND LINER DRILLING BITS AND REAMERS, CUTTING ELEMENTS THEREFOR, AND METHODS OF USE