TESTER FOR INTEGRATED CIRCUIT ELEMENT,申请号JP19870295771-传众专利搜索

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发明名称	TESTER FOR INTEGRATED CIRCUIT ELEMENT
摘要
申请公布号	JPH01136080(A)	申请公布日期	1989.05.29
申请号	JP19870295771	申请日期	1987.11.24
申请人	NEC YAMAGATA LTD	发明人	MAKI MAMORU
分类号	G01R31/317;G01R31/28	主分类号	G01R31/317
代理机构		代理人
主权项
地址

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