发明名称 Two parameter clutter map
摘要 A two-parameter clutter map for storing two variables for every spatial location in order to define both the intensity of the interference and the fluctuation characteristics of the interference from scan-to-scan. The two variables are obtained by processing input data from an integrator in two n-pole integrators having different orders. The ratio of the two variables or their difference in logarithmic form is employed as a measure of the scan-to-scan fluctuation characteristics. An option to control alarms and the leading edge of moving rain storms is also provided.
申请公布号 US4940988(A) 申请公布日期 1990.07.10
申请号 US19880266192 申请日期 1988.11.02
申请人 WESTINGHOUSE ELECTRIC CORP. 发明人 TAYLOR, JR., JOHN W.
分类号 G01S13/524 主分类号 G01S13/524
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