| 摘要 |
<p>PURPOSE:To perform inspection fast by short-circuiting >=10 source signal lines in common, connecting common blocks to short rings formed at a peripheral part, and separating the source signal lines, block by block, and performing block inspection. CONSTITUTION:Signal lines to which thin film transistors(TFT) are connected are connected to 1st conductor wires 102 - 107 and 1st conductor wires 102 - 107 are connected to a 2nd conductor wire 101 in common. Namely, >=10 source signal lines 108 are short-circuited in common and the respective common blocks are connected to the short rings 101 formed at the peripheral part. Consequently, when defect inspection is performed, the inspection is carried out, block by block and if a defect occurs in a block, inspection is performed while the signal lines are separated individually, so the inspection is speeded up.</p> |
