发明名称 Reduced latchup in precharging I/O lines to sense amp signal levels
摘要 I/O lines on a CMOS circuit are precharged to preferred voltage levels in order to avoid latch up. The precharging is achieved by using N channel transistors to provide a precharge which is at a threshold voltage (VT) below bias voltage VCC, or (VCC-VT). This results in a lower forward bias when VCC bumps down after the I/O lines are floated. By lowering the precharge voltage by a level corresponding to a threshold voltage (VT), the allowed range of power supply voltage bumping is increased by this amount. This eliminmates the destructive effect of a negative bump of VBE, which would have presented a diode forward bias condition. Instead, the power supply may bump to (VBE+VT).
申请公布号 US4962326(A) 申请公布日期 1990.10.09
申请号 US19880222842 申请日期 1988.07.22
申请人 MICRON TECHNOLOGY, INC. 发明人 PARKINSON, WARD D.;CHERN, WEN-FOO
分类号 G11C7/10;H03K19/003 主分类号 G11C7/10
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