发明名称 Process for passivating crystal defects in a polycrystalline silicon material.
摘要 A process for passivating crystal defects in polycrystalline or amorphous silicon material by thermal treatment in a hydrogen- containing atmosphere is intended to make it readily possible to achieve beneficial diode properties and/or beneficial passivation properties in amorphous or polycrystalline silicon material. Hydrogen/oxygen compounds are reduced at the surface of the silicon material, producing atomic hydrogen which diffuses into the silicon material. <IMAGE>
申请公布号 EP0419693(A1) 申请公布日期 1991.04.03
申请号 EP19890117694 申请日期 1989.09.25
申请人 SIEMENS AKTIENGESELLSCHAFT 发明人 MUENZER, ADOLF, DIPL.-PHYS.
分类号 H01L31/10;H01L21/30;H01L31/04 主分类号 H01L31/10
代理机构 代理人
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