发明名称 |
Process for passivating crystal defects in a polycrystalline silicon material. |
摘要 |
A process for passivating crystal defects in polycrystalline or amorphous silicon material by thermal treatment in a hydrogen- containing atmosphere is intended to make it readily possible to achieve beneficial diode properties and/or beneficial passivation properties in amorphous or polycrystalline silicon material. Hydrogen/oxygen compounds are reduced at the surface of the silicon material, producing atomic hydrogen which diffuses into the silicon material.
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申请公布号 |
EP0419693(A1) |
申请公布日期 |
1991.04.03 |
申请号 |
EP19890117694 |
申请日期 |
1989.09.25 |
申请人 |
SIEMENS AKTIENGESELLSCHAFT |
发明人 |
MUENZER, ADOLF, DIPL.-PHYS. |
分类号 |
H01L31/10;H01L21/30;H01L31/04 |
主分类号 |
H01L31/10 |
代理机构 |
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