发明名称 METHOD OF MANUFACTURING DRAM CELL HAVING SPACE WALL OXIDE
摘要 forming a first trench (36) at the predetermined portion of a substrate; forming a space wall oxide layer (23) on the side wall of the trench (36); forming a second trench (38) etched deeper in the first trench (36); forming a diffusion layer (26) on the side and bottom of the trench (38); forming electrodes on the inside of the first and second trenches; forming a device separating oxide film including a part of the electrodes; removing the space wall oxide formed on the opposite side of the device separating oxide film to form a bridge poly (31); forming a gate poly (35) on the substre; and formign soruce and drain regions on the gate poly. The bridge poly for connecting between a transistor and a capacitor is easily formed.
申请公布号 KR910004504(B1) 申请公布日期 1991.07.05
申请号 KR19880004647 申请日期 1988.04.23
申请人 SAMSUNG ELECTRONICS CO.LTD. 发明人 OH KYONG-SOG
分类号 G11C11/34;H01L27/108;(IPC1-7):H01L27/108 主分类号 G11C11/34
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