发明名称 |
METHOD OF MANUFACTURING DRAM CELL HAVING SPACE WALL OXIDE |
摘要 |
forming a first trench (36) at the predetermined portion of a substrate; forming a space wall oxide layer (23) on the side wall of the trench (36); forming a second trench (38) etched deeper in the first trench (36); forming a diffusion layer (26) on the side and bottom of the trench (38); forming electrodes on the inside of the first and second trenches; forming a device separating oxide film including a part of the electrodes; removing the space wall oxide formed on the opposite side of the device separating oxide film to form a bridge poly (31); forming a gate poly (35) on the substre; and formign soruce and drain regions on the gate poly. The bridge poly for connecting between a transistor and a capacitor is easily formed.
|
申请公布号 |
KR910004504(B1) |
申请公布日期 |
1991.07.05 |
申请号 |
KR19880004647 |
申请日期 |
1988.04.23 |
申请人 |
SAMSUNG ELECTRONICS CO.LTD. |
发明人 |
OH KYONG-SOG |
分类号 |
G11C11/34;H01L27/108;(IPC1-7):H01L27/108 |
主分类号 |
G11C11/34 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|