| 摘要 |
<p>A detector arrangement is disclosed for an industrial CT x-ray system which uses a three-dimensional cone beam (12) to irradiate the specimen (15) and a large two-dimensional scintillation screen (40) to develop a light image corresponding to the energy of the attenuated radiation beams. The light image is focused by a special lens arrangement (43) with zoom (60) capability onto the photocathode of an intensifier (45). The intensified light image developed is transmitted by fiber optics (75) to a plurality of CCD chips, each chip (86) developing electrical signals corresponding to a segment of the image developed in the intensifier (45). The chips are clocked in a predetermined manner based on a priori information developed in an initial scan to produce a high resolution image of large industrial objects (15) in a short time.</p> |
