A SEMICONDUCTOR MEMORY DEVICE COMPRISING A TEST CIRCUIT AND A METHOD OF OPERATION THEREOF,申请号GB19910018276-传众专利搜索

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发明名称	A SEMICONDUCTOR MEMORY DEVICE COMPRISING A TEST CIRCUIT AND A METHOD OF OPERATION THEREOF
摘要
申请公布号	GB9118276(D0)	申请公布日期	1991.10.09
申请号	GB19910018276	申请日期	1991.08.23
申请人	MITSUBISHI DENKI K.K.	发明人
分类号	G11C11/409;G11C11/401;G11C29/00;G11C29/34	主分类号	G11C11/409
代理机构		代理人
主权项
地址

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