发明名称 VERFAHREN ZUR HERSTELLUNG VON MIKROSTRUKTUREN MIT BEREICHSWEISE UNTERSCHIEDLICHER STRUKTURHOEHE
摘要 PCT No. PCT/DE91/00602 Sec. 371 Date Mar. 31, 1992 Sec. 102(e) Date Mar. 31, 1992 PCT Filed Jul. 25, 1991 PCT Pub. No. WO92/02858 PCT Pub. Date Feb. 20, 1992.A method of producing microstructures having regions of different structural height includes providing a layer of positive resist material that is sensitive to X-ray radiation with microstructures on a side facing a source of X-rays. Using a mask, the layer of a positive resist material is partially irradiated with the X-rays. The irradiated regions are removed with the aid of a developer.
申请公布号 DE4024275(A1) 申请公布日期 1992.02.06
申请号 DE19904024275 申请日期 1990.07.31
申请人 KERNFORSCHUNGSZENTRUM KARLSRUHE GMBH, 7500 KARLSRUHE, DE;BUERKERT GMBH, 7118 INGELFINGEN, DE 发明人 KOWANZ, BERND, 7515 LINKENHEIM, DE;BACHER, WALTER, DR., 7513 STUTENSEE, DE;BLEY, PETER, DR., 7514 EGGENSTEIN-LEOPOLDSHAFEN, DE;HARMENING, MICHAEL, DR., 7513 STUTENSEE, DE;MOHR, JUERGEN, DR., 7511 SULZFELD, DE
分类号 G03F7/26;G02B6/122;G03F1/00;G03F1/14;G03F1/22;G03F7/00;G03F7/20;H01L21/027 主分类号 G03F7/26
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