发明名称 |
METHOD FOR THE ANALYSIS OF A GAS SAMPLE, ANALYSIS ARRANGEMENT, USES THEREOF AND TEST PLANT COMPRISING THE SAID ARRANGEMENT |
摘要 |
Rapid sequences of gas samples (G) are taken to a semiconductor sensor (60a,b,c) for analysis. The analysis procedure is accelerated by differentiating the semiconductor sensor output signals in time (61) and taking successive gas samples (59) to the semiconductor sensors (60a to 60c) sequentially. In cycle stages in which the semiconductor sensor concerned (60a to 60c) receives no gas samples, the lines and casing are flushed with gas (S). The effect of the flushing process on the semiconductor output signal (A) is minimised by adjusting the flushing gas and/or the flow rate ratio between the flushing gas and the gas sample in the semiconductor region.
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申请公布号 |
CA2074939(A1) |
申请公布日期 |
1992.06.07 |
申请号 |
CA19912074939 |
申请日期 |
1991.12.04 |
申请人 |
LEHMAN, MARTIN |
发明人 |
MATTER, ULRICH;NUENLIST, RENE;BURTSCHER, HEINZ;MUKROWSKY, MICHAEL |
分类号 |
G01N21/35;G01N27/00;G01N27/12;G01N33/00;G01N33/44;(IPC1-7):G01N33/00;G06F15/20 |
主分类号 |
G01N21/35 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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