发明名称 THREE-DIMENSIONAL CONTOUR PROCESSING METHOD
摘要 PURPOSE:To make it possible to obtain an interference line between a free curved surface and another free curved surface and an interference line between a free curve and a free curved surface in a three-dimensional contour by providing a means of dividing interference lines at interference points between an array of curves obtained by a curve array generating means or the like. CONSTITUTION:A point that can be the terminal interference point is registered in advance in a terminal point table, whether or not interference points can be traced from the obtained terminal point, and if the tracing is possible, a tracing direction is determined and the leading point of the tracing vector is converged so as to reach onto both curved surfaces. Although curve arrays are generated by points on both interference lines and the directional vectors obtained by an interference line tracing unit 12, this processing is carried out by a curve array generating unit 13. If a plurality of curve arrays are obtained by the curve array generating unit 13, an interference point can be obtained between curve arrays, and if the inter ference point is obtained, an interference line is divided at the interference point, and this processing 18 carried out by an interference number dividing unit 14. Further, by sequentially combining interference line dividing units 14 using a convexed space interference inspection unit 3, an interference line between two free curved surfaces can be obtained.
申请公布号 JPH04243487(A) 申请公布日期 1992.08.31
申请号 JP19910018315 申请日期 1991.01.17
申请人 RICOH CO LTD 发明人 TAKAMURA TEIJI
分类号 G06F17/50;G06T17/00 主分类号 G06F17/50
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