| 摘要 |
<p>A low-voltage, compact measuring apparatus for measuring any one of thickness, density and denier of a material (17) is disclosed which uses a PIN diode (21) in conjunction with a low noise processing circuit to detect particle radiation emitted from a source (15), which source has its detection intensity affected by a material to be measured. A light blocking, particle radiation permeable material (19) protects the PIN diode from detecting light radiation. A system for controlling the extrusion of a film using the measuring apparatus, and for correcting for erroneous measurement caused by web flutter, are also disclosed.</p> |
