METHOD OF MEASURING THIN TRANSPARENT AND SEMITRANSPARENT LAYERS,申请号SU19904854692-传众专利搜索

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发明名称	METHOD OF MEASURING THIN TRANSPARENT AND SEMITRANSPARENT LAYERS
摘要
申请公布号	RU1772627(C)	申请公布日期	1992.10.30
申请号	SU19904854692	申请日期	1990.07.19
申请人	NII MEKHANIKI FIZ PRI SARATOVSKOM G UNIVERSITETE	发明人	USANOV DMITRIJ A,SU;KURENKOVA OLGA N,SU;SKRIPAL ANATOLIJ V,SU;FEKLISTOV VLADIMIR B,SU
分类号	G01B21/08	主分类号	G01B21/08
代理机构		代理人
主权项
地址

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