SEMICONDUCTOR MEMORY TESTER WITH DATA WIDTH CHANGING FUNCTION,申请号JP19920012467-传众专利搜索

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发明名称	SEMICONDUCTOR MEMORY TESTER WITH DATA WIDTH CHANGING FUNCTION
摘要
申请公布号	JPH05203705(A)	申请公布日期	1993.08.10
申请号	JP19920012467	申请日期	1992.01.28
申请人	ADVANTEST CORP	发明人	OSHIMA HIROMI
分类号	G01R31/3183;G01R31/28;G11C29/00;G11C29/10;G11C29/56	主分类号	G01R31/3183
代理机构		代理人
主权项
地址

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