发明名称 Method of manufacturing substrate having semiconductor on insulator.
摘要 <p>A polysilicon layer (8) is formed on a surface of a silicon substrate (1). Oxygen ions (2) are implanted into the silicon substrate through the polysilicon layer, and an SiO2 film (3) is formed in the silicon substrate at a position in a prescribed depth from the surface of silicon substrate. A heat treatment is performed to a silicon layer (4) between the polysilicon layer and the SiO2 film, thereby providing an SOI layer (5) with improved crystal quality. &lt;IMAGE&gt;</p>
申请公布号 EP0556795(A2) 申请公布日期 1993.08.25
申请号 EP19930102468 申请日期 1993.02.17
申请人 MITSUBISHI DENKI KABUSHIKI KAISHA;MITSUBISHI MATERIALS CORPORATION 发明人 NAKAI, TETSUYA;YAMAGUCHI, YASUO;NISHIMURA, TADASHI
分类号 H01L21/20;H01L21/265;H01L21/322;H01L21/762;(IPC1-7):H01L21/76 主分类号 H01L21/20
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