发明名称 SEGREGATION METHOD FOR SEMICONDUCTOR DEVICE
摘要 The isolation method comprises the steps of; forming SRO (stress relief oxide) on a silicone substrate and a nitride layer, forming an active pattern and etching said nitride layer and SRO, a light oxidizing side wall of said etched silicone substrate, N2 ion injecting and annealing to form oxynitride of SixNyOz, dipping in HF and field oxidizing, thereby preventing stress generation and bird's beak.
申请公布号 KR940003224(B1) 申请公布日期 1994.04.16
申请号 KR19910017941 申请日期 1991.10.12
申请人 GOLDSTAR ELECTRON CO., LTD. 发明人 LEE, CHANG - JAE
分类号 H01L21/76;(IPC1-7):H01L21/76 主分类号 H01L21/76
代理机构 代理人
主权项
地址