A nanodot nonvolatile memory element comprises a substrate having a source and a drain region formed therein, and an insulating layer formed on the substrate. The insulating layer contains a nanocrystalline floating gate of approximately three -to six nanometers in diameter formed at a distance of approximately two to five nanometers from the substrate, and a carbon nanotube control gate having a diameter of approximately six nanometers or less is formed at a distance of approximately 10-15 nanometers from the substrate.
申请公布号
WO2008127293(A2)
申请公布日期
2008.10.23
申请号
WO2007US22167
申请日期
2007.10.17
申请人
MICRON TECHNOLOGY, INC.;BHATTACHARYYA, ARUP;FARNWORTH, WARREN, M.;FARRAR, PAUL, A.
发明人
BHATTACHARYYA, ARUP;FARNWORTH, WARREN, M.;FARRAR, PAUL, A.