发明名称 HIGH DENSITY NANODOT NONVOLATILE MEMORY
摘要 A nanodot nonvolatile memory element comprises a substrate having a source and a drain region formed therein, and an insulating layer formed on the substrate. The insulating layer contains a nanocrystalline floating gate of approximately three -to six nanometers in diameter formed at a distance of approximately two to five nanometers from the substrate, and a carbon nanotube control gate having a diameter of approximately six nanometers or less is formed at a distance of approximately 10-15 nanometers from the substrate.
申请公布号 WO2008127293(A2) 申请公布日期 2008.10.23
申请号 WO2007US22167 申请日期 2007.10.17
申请人 MICRON TECHNOLOGY, INC.;BHATTACHARYYA, ARUP;FARNWORTH, WARREN, M.;FARRAR, PAUL, A. 发明人 BHATTACHARYYA, ARUP;FARNWORTH, WARREN, M.;FARRAR, PAUL, A.
分类号 H01L21/28;G11C13/02;G11C16/04;H01L21/027;H01L21/768;H01L21/8247;H01L27/115;H01L27/28;H01L29/06;H01L29/423;H01L29/788;H01L51/00;H01L51/05;H01L51/10 主分类号 H01L21/28
代理机构 代理人
主权项
地址