发明名称 SEMICONDUCTOR TEST DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a semiconductor test device which makes the position of a reel in an automatic handler be at a constant height irrespective of the size of a test head, the footprint of the automatic handler constant, and the position where a cable connected to the test head be drawn out be arbitrarily set. SOLUTION: In the semiconductor test device using the automatic handler for TAB constituted so as to test an IC chip by conveying the IC chip mounted on a tape to a measurement position of the test head, the automatic handler for TAB is arranged so that the tape on which the IC chip is mounted travels in a vertical direction with the test head arranged in the vertical direction so that the measurement position is disposed opposite the tape. COPYRIGHT: (C)2009,JPO&INPIT
申请公布号 JP2008256650(A) 申请公布日期 2008.10.23
申请号 JP20070101689 申请日期 2007.04.09
申请人 YOKOGAWA ELECTRIC CORP 发明人 FURUTA MITSUHIRO;HIRAO SACHIKO
分类号 G01R31/26 主分类号 G01R31/26
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