发明名称 REDUCING TRAP EFFECTS IN A SCINTILLATOR BY APPLICATION OF SECONDARY RADIATION
摘要 According to an embodiment of the invention, a radiation detector device (10) for detecting a primary radiation (6) comprises a scintillator (12) which generates a converted primary radiation in response to incoming primary radiation (6) and a photo detector (14) for detecting the converted primary radiation. The radiation detector device (10) further comprises a secondary radiation source (20) for irradiating the scintillator (12) with a secondary radiation (22) which has a wavelength different from a wavelength of the first radiation (6) and which is capable of producing a spatially more uniform response of the scintillator (12) to primary radiation. In an embodiment of the invention, the radiation detector device (10) is an X-ray detector of an X-ray imaging apparatus where the primary radiation is X-ray radiation and the secondary radiation has a wavelength between 350 nm and 450 nm. According to an embodiment, the irradiation with the secondary radiation, e.g. UV radiation, produces a uniform gain distribution of the X-ray detector (10).
申请公布号 WO2008126009(A2) 申请公布日期 2008.10.23
申请号 WO2008IB51329 申请日期 2008.04.08
申请人 PHILIPS INTELLECTUAL PROPERTY & STANDARDS GMBH;KONINKLIJKE PHILIPS ELECTRONICS N.V.;SNOEREN, RUDOLPH, M.;STEINHAUSER, HEIDRUN;NOORDHOEK, NICOLAAS, J.;SIMON, MATTHIAS 发明人 SNOEREN, RUDOLPH, M.;STEINHAUSER, HEIDRUN;NOORDHOEK, NICOLAAS, J.;SIMON, MATTHIAS
分类号 G01T1/29 主分类号 G01T1/29
代理机构 代理人
主权项
地址