发明名称 PROJECTION SYSTEM, SHAPE MEASURING DEVICE, AND OPTICAL CHARACTERISTIC EVALUATION DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a projection system having a function capable of easily measuring and evaluating the deflection of a screen, the optical characteristics of a projection optical system or the like. SOLUTION: The projection system includes: a first pattern 2; an optical path branching means (half mirror 6) by which light emitted from the first pattern 2 is transmitted toward a projection lens 5 and light from the screen 3, emitted from the projection lens 5, is reflected; an imaging element 7 that captures light reflected by the optical path branching means; a second pattern disposed on the imaging face of the screen 3 or (near) an imaging face of the imaging element. The image of the first pattern 2 is projected onto the screen 3 by the projection lens 5. The image of the first pattern 2 on the screen 3 is projected onto the imaging element 7 by the projection lens 5. A moire stripe, arising from interference between the image of the first pattern 2 and the image of the second pattern 4 is detected by the imaging element 7. COPYRIGHT: (C)2009,JPO&INPIT
申请公布号 JP2008257125(A) 申请公布日期 2008.10.23
申请号 JP20070101881 申请日期 2007.04.09
申请人 SEIKO EPSON CORP 发明人 MORIKUNI HIDETOKI;SEKI HIDEYA
分类号 G03B21/10 主分类号 G03B21/10
代理机构 代理人
主权项
地址