发明名称 METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE
摘要 <P>PROBLEM TO BE SOLVED: To provide a method for manufacturing a semiconductor device equipped with a gold bump electrode for reducing the waste of material costs, and for reducing the number of processes. <P>SOLUTION: This method for manufacturing a semiconductor device including a process for forming a gold bump posterior to a process for forming a passivation film includes: a process for despositing a polyimide film having positive type photosensitivity; a first exposure process for carrying out exposure to form an opening at a position where the gold bump is formed to the deposited polyimide film; and a second exposure process for carrying out exposure to the predetermined section of the polyimde film after forming the gold bump at the formed opening. <P>COPYRIGHT: (C)2009,JPO&INPIT
申请公布号 JP2008258439(A) 申请公布日期 2008.10.23
申请号 JP20070099660 申请日期 2007.04.05
申请人 KAWASAKI MICROELECTRONICS KK 发明人 OCHI TSUNEO
分类号 H01L21/60 主分类号 H01L21/60
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