发明名称 |
MANUFACTURING METHOD OF POLISHING PAD, POLISHING PAD, AND POLISHING METHOD OF WAFER |
摘要 |
<P>PROBLEM TO BE SOLVED: To provide a manufacturing method or the like of a polishing pad capable of stably obtaining a wafer having high flatness. <P>SOLUTION: The manufacturing method of the polishing pad which is made of foam urethane pad and used for polishing the wafer by being attached to a platen is characterized in that it has a process which slices at least a foam urethane cake to make the foam urethane pad, and a process which presses the foam urethane pad at the pressure of 15000g/cm<SP>2</SP>or more. <P>COPYRIGHT: (C)2009,JPO&INPIT |
申请公布号 |
JP2008254123(A) |
申请公布日期 |
2008.10.23 |
申请号 |
JP20070099184 |
申请日期 |
2007.04.05 |
申请人 |
SHIN ETSU HANDOTAI CO LTD |
发明人 |
KANETANI KOICHI;SEKIZAWA MASAYOSHI;TOYAMA NAOTAKA |
分类号 |
B24B37/24;H01L21/304 |
主分类号 |
B24B37/24 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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