发明名称 MANUFACTURING METHOD OF POLISHING PAD, POLISHING PAD, AND POLISHING METHOD OF WAFER
摘要 <P>PROBLEM TO BE SOLVED: To provide a manufacturing method or the like of a polishing pad capable of stably obtaining a wafer having high flatness. <P>SOLUTION: The manufacturing method of the polishing pad which is made of foam urethane pad and used for polishing the wafer by being attached to a platen is characterized in that it has a process which slices at least a foam urethane cake to make the foam urethane pad, and a process which presses the foam urethane pad at the pressure of 15000g/cm<SP>2</SP>or more. <P>COPYRIGHT: (C)2009,JPO&INPIT
申请公布号 JP2008254123(A) 申请公布日期 2008.10.23
申请号 JP20070099184 申请日期 2007.04.05
申请人 SHIN ETSU HANDOTAI CO LTD 发明人 KANETANI KOICHI;SEKIZAWA MASAYOSHI;TOYAMA NAOTAKA
分类号 B24B37/24;H01L21/304 主分类号 B24B37/24
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