| 摘要 |
The method for a test and measurement instrument includes the steps of: providing a test and measurement instrument; attaching a Device Under Test (DUT) to a signal source to be measured with at least one channel of the signal source in electronic communication with at least one of the acquisition modules; collecting data from the DUT; storing the collected data from the DUT in the acquisition module(s); dividing the collected data from the DUT into a plurality of pieces; assigning the plurality of pieces to the plurality of system buses; transferring the plurality of pieces to the memory connected to the processors by moving the plurality of pieces in parallel over their assigned system buses; processing the plurality of pieces with the plurality of processors; and displaying the results obtained by processing the priority of pieces with the plurality of processors.
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