| 摘要 |
The apparatus for a test and measurement instrument consists of multiple integrated circuits with each integrated circuit being connected to its own memory controller. At least one of the integrated circuits is a specialized integrated circuit, which may be a graphics processing unit, a digital signal processor, or a field-programmable gate array. Each memory controller is connected to its own memory. The integrated circuits are connected in a circular arrangement by multiple high-speed interconnects. A bridge is connected to at least the first and last integrated circuits. A system bus connects the bridge to an acquisition module. The acquisition module has a signal bus interface with the system bus being connected to the acquisition module and having its own acquisition hardware. The acquisition hardware is a direct memory access machine that can transfer data to any portion of the memory. There is a signal source connected to the signal bus interface.
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