发明名称 APPARATUS FOR A TEST AND MEASUREMENT INSTRUMENT
摘要 Apparatuses for a test and measurement instrument provide a scalable test and measurement instrument capable of handling the acquisition, transfer, analysis, and display of large quantities of waveform data as well as complex waveforms. The apparatus for a test and measurement instrument consists of multiple processors with memory connected to the processors. There are multiple bridges with each processor being connected to its own bridge. There are multiple system buses with each bridge been connected to its own system bus. There are multiple acquisition modules having signal bus interfaces with each system bus being connected to its own acquisition module and having its own acquisition hardware. Each piece of acquisition hardware is a direct memory access machine that can transfer data to any portion of the memory. There are multiple signal sources with each signal source being connected to its own signal bus interface.
申请公布号 US2008262767(A1) 申请公布日期 2008.10.23
申请号 US20080051187 申请日期 2008.03.19
申请人 TEKTRONIX, INC. 发明人 SEDEH MEHRAB S.
分类号 G01R13/00 主分类号 G01R13/00
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