发明名称 METHOD OF MAKING A SEMICONDUCTOR DEVICE WITH A STRESSOR
摘要 First and second transistors are formed adjacent to each other. Both transistors have gate sidewall spacers removed. A stressor layer is formed overlying the first and second transistors. Stress in the stressor layer that overlies the first transistor is modified. Stress in the stressor layer that overlies the second transistor is permanently transferred to a channel of the second transistor. The stressor layer is removed except adjacent the gate electrode sidewalls of the first transistor and the second transistor where the stressor layer is used as gate sidewall spacers. Electrical contact to electrodes of the first transistor and the second transistor is made while using the gate sidewall spacers for determining a physical boundary of current electrodes of the first and second transistors. Subsequently formed first and a second stressors are positioned close to transistor channels of the first and second transistors.
申请公布号 US2008261355(A1) 申请公布日期 2008.10.23
申请号 US20070737492 申请日期 2007.04.19
申请人 GOKTEPELI SINAN;KOLAGUNTA VENKAT R 发明人 GOKTEPELI SINAN;KOLAGUNTA VENKAT R.
分类号 H01L21/8238 主分类号 H01L21/8238
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