| 摘要 |
PROBLEM TO BE SOLVED: To provide a sample holder suppressed in contacting with composition members in an analyzer and capable of easily arranging a sample at a suitable position when the sample for a transmission type electron microscope is analyzed. SOLUTION: In order to analyze a sample 11 for a transmission type electron microscope fixed to a mesh 10 by an analyzer, the sample holder 100 holding the sample 11 has a base 20 in which the mesh 10 fixed with the sample 11 is arranged, and a pressure plate 30 which partially contacts with the mesh 10 arranged at the base 20, and presses the mesh 10 to the base 20. In a state of holding the mesh 10 fixed with the sample 11, the base 20, a part other than the upper surface of a part (a plate main part 32) pressing the mesh 10 at the pressure plate 30, and a screw 40 are placed at lower positions of the upper surface of the part (the plate main part 32) pressing the mesh 10 at the pressure plate 30. COPYRIGHT: (C)2009,JPO&INPIT
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