发明名称 Structure for Preventing Peeling of Reaction Product, Process for Its Production and Process for the Production of a Semiconductor Device Using the Structure
摘要 The peeling of a reaction product deposition film 50 is prevented, reducing the particle contamination of a material to be treated 16 by roughening the surfaces (adhesion preventing surfaces) of an outer liner 40 and inner liner 42 both made of aluminum installed as an adhesion preventing plate inside a chamber of a plasma etching device to a surface roughness within a constant range without carrying out alumite treatment.
申请公布号 US2008261074(A1) 申请公布日期 2008.10.23
申请号 US20080107180 申请日期 2008.04.22
申请人 TEXAS INSTRUMENTS INCORPORATED 发明人 SHISHIKURA HIROTSUGU
分类号 D06N7/04;B24C1/00;C23F4/00 主分类号 D06N7/04
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