发明名称 POWER TEST DEVICE AND METHOD THEREOF
摘要 A power test device and a method thereof are provided. The power test method includes the following steps. First, a piece of control information is generated by a circuit under test, and a specific voltage and a sensing signal are generated according to the control information. Then, the sensing signal is converted to a piece of scale information, and a piece of power information is obtained by calculating the scale information and is displayed. Therefore, the present invention can obtain the power consumption of the circuit under test without actions such as dismantling a plate and cutting off a conducting wire on the plate.
申请公布号 US2008262762(A1) 申请公布日期 2008.10.23
申请号 US20080105293 申请日期 2008.04.18
申请人 ASUSTEK COMPUTER INC. 发明人 KO CHUN-WEI
分类号 G01R21/00 主分类号 G01R21/00
代理机构 代理人
主权项
地址