发明名称 TRENCH METAL OXIDE SEMICONDUCTOR
摘要 <p>A trench metal oxide semiconductor is provided to prevent edge leakage by implementing a remote contact in a polysilicon area of TMBS devices. A trench metal oxide semiconductor includes a TMBS(Trench MOS Barrier Schottky) device. The TMBS device includes a source metal layer and plural substrates(205) having plural first trenches(210-215) which include conductive materials. The TMBS device includes an active area. The source metal layer is electrically contacted with the substrates in the active area and insulated with the conductive materials disposed in the first trenches. The conductive materials disposed in the trenches are electrically coupled with a contact implemented at an outer of the active area of the TMBS device.</p>
申请公布号 KR20080094617(A) 申请公布日期 2008.10.23
申请号 KR20080036192 申请日期 2008.04.18
申请人 VISHAY-SILICONIX 发明人 PATTANAYAK DEVA N.;TERRILL KYLE;SHI SHARON;LEE MISHA;BAI YUMING;LUI KAM;CHEN KUO IN
分类号 H01L29/78 主分类号 H01L29/78
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