发明名称 PHOTOLITHOGRAPHY MASK WITH PROTECTIVE CAPPING LAYER
摘要 A photomask and a method of fabricating the photomask. The photomask including: a substrate transparent to a selected wavelength or wavelengths of radiation, the substrate having a top surface and an opposite bottom surface, the substrate having a printable region and a non-printable region; the printable region having first opaque regions raised above the top surface of the substrate adjacent to clear regions, each opaque region of the first opaque regions having sidewalls and a top surface; the non-printable region comprising a second opaque region raised above the top surface of the substrate, the second opaque region having sidewalls and a top surface; and a capping layer on the sidewalls of the first opaque regions and the sidewalls of the second opaque region.
申请公布号 US2008261122(A1) 申请公布日期 2008.10.23
申请号 US20070738070 申请日期 2007.04.20
申请人 GAMBINO JEFFREY PETER;LEIDY ROBERT KENNETH;PETERSON KIRK DAVID;RANKIN JED HICKORY;SPROGIS EDMUND JURIS 发明人 GAMBINO JEFFREY PETER;LEIDY ROBERT KENNETH;PETERSON KIRK DAVID;RANKIN JED HICKORY;SPROGIS EDMUND JURIS
分类号 G03C5/00;G03F1/00 主分类号 G03C5/00
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