发明名称 Systems and Methods for Resistance Compensation in a Temperature Measurement Circuit
摘要 Various systems and methods for temperature measurement are disclosed. For example, some embodiments of the present invention provide methods for temperature measurement that include exciting a provided transistor with at least four sequential input signals of different magnitudes. In response, the transistor exhibits a sequence of output signals corresponding to the four sequential input signals. The sequence of output signals is sensed using a different gain for each of the output signals included in the sequence of output signals, and the output signals included in the sequence of output signals are combined such that the combined output signals eliminates a resistance error. The combined output signals are then used to calculate a temperature of the transistor.
申请公布号 US2008259999(A1) 申请公布日期 2008.10.23
申请号 US20070738584 申请日期 2007.04.23
申请人 TEXAS INSTRUMENTS INCORPORATED 发明人 GARDNER MARCO A.;DORRENBOS JERRY L.
分类号 G01K7/00 主分类号 G01K7/00
代理机构 代理人
主权项
地址