发明名称 DUAL GATED FINFET GAIN CELL
摘要 A memory gain cell for a memory circuit, a memory circuit formed from multiple memory gain cells, and methods of fabricating such memory gain cells and memory circuits. The memory gain cell includes a storage device capable of holding a stored electrical charge, a write device, and a read device. The read device includes a fin of semiconducting material, electrically-isolated first and second gate electrodes flanking the fin, and a source and drain formed in the fin adjacent to the first and the second gate electrodes. The first gate electrode is electrically coupled with the storage device. The first and second gate electrodes are operative for gating a region of the fin defined between the source and the drain to thereby regulate a current flowing from the source to the drain. When gated, the magnitude of the current is dependent upon the electrical charge stored by the storage device.
申请公布号 US2008261363(A1) 申请公布日期 2008.10.23
申请号 US20080144139 申请日期 2008.06.23
申请人 INTERNATIONAL BUSINESS MACHINES CORPORATION 发明人 FURUKAWA TOSHIHARU;HAKEY MARK CHARLES;HORAK DAVID VACLAV;KOBURGER CHARLES WILLIAM;MASTERS MARK ELIOT;MITCHELL PETER H.
分类号 H01L21/8242;G11C7/00;H01L27/108 主分类号 H01L21/8242
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