Integrated Circuit, Memory Module, Method of Operating an Integrated Circuit, Method of Fabricating an Integrated Circuit, Computer Program Product, and Computing System

摘要

According to one embodiment of the present invention, an integrated circuit includes a plurality of memory cells, the integrated circuit being operable in a memory cell testing mode in which testing signals are applied to the memory cells, wherein the strengths and durations of the testing signals at least partly differ from the strengths and durations of programming signals or sensing signals used for programming and sensing memory states of the memory cells.